VLSI Research Inc.

Mike Mayberry ran the test development group for a number of years before being promoted to Director of Components Research at Intel. In this video, you'll find out what the future challenges are in testing. He describes how feed-forward works in test, adaptive manufacturing, and what predictive DPM is all about. You'll learn how and why they used consortia to promote the transition to structural test and what was accomplished as a result.

Click here for more Chip Insider® Live Interviews

Copyright ©  VLSI Research Inc. All rights reserved.